Showing 1 - 3 results of 3 for search 'Tom Hovell', query time: 0.02s Refine Results
  1. 1
    Pragmatic Micrometre to Millimetre Calibration Using Multiple Methods for Low-Coherence Interferometer in Embedded Metrology Applications

    Pragmatic Micrometre to Millimetre Calibration Using Multiple Methods for Low-Coherence Interferometer in Embedded Metrology Applications by Tom Hovell, Jon Petzing, Laura Justham, Peter Kinnell

    Published 2021-07-01
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  2. 2
    From Light to Displacement: A Design Framework for Optimising Spectral-Domain Low-Coherence Interferometric Sensors for In Situ Measurement

    From Light to Displacement: A Design Framework for Optimising Spectral-Domain Low-Coherence Interferometric Sensors for In Situ Measurement by Tom Hovell, Jon Petzing, Laura Justham, Peter Kinnell

    Published 2020-11-01
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  3. 3
    Measurement Techniques for Three-Dimensional Metrology of High Aspect Ratio Internal Features—A Review

    Measurement Techniques for Three-Dimensional Metrology of High Aspect Ratio Internal Features—A Review by Tom Hovell, Jon Petzing, Wen Guo, Connor Gill, Laura Justham, Niels Lohse, Peter Kinnell

    Published 2023-04-01
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