Majority and Minority Charge Carrier Traps in n-Type 4H-SiC Studied by Junction Spectroscopy Techniques by Ivana Capan, Tomislav Brodar

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Structural and Electrical Characterization of Pure and Al-Doped ZnO Nanorods by Ivana Panžić, Ivana Capan, Tomislav Brodar, Arijeta Bafti, Vilko Mandić

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M-Center in Neutron-Irradiated 4H-SiC by Ivana Capan, Tomislav Brodar, Takahiro Makino, Vladimir Radulovic, Luka Snoj

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Minority Carrier Trap in <i>n</i>-Type 4H–SiC Schottky Barrier Diodes by Ivana Capan, Yuichi Yamazaki, Yuya Oki, Tomislav Brodar, Takahiro Makino, Takeshi Ohshima

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Depth Profile Analysis of Deep Level Defects in 4H-SiC Introduced by Radiation by Tomislav Brodar, Luka Bakrač, Ivana Capan, Takeshi Ohshima, Luka Snoj, Vladimir Radulović, Željko Pastuović

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Response of 4H-SiC Detectors to Ionizing Particles by Robert Bernat, Ivana Capan, Luka Bakrač, Tomislav Brodar, Takahiro Makino, Takeshi Ohshima, Željko Pastuović, Adam Sarbutt

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One-Pot Synthesis of Sulfur-Doped TiO₂/Reduced Graphene Oxide Composite (S-TiO₂/rGO) with Improved Photocatalytic Activity for the Removal of Diclofenac from... by Marin Kovačić, Klara Perović, Josipa Papac, Antonija Tomić, Lev Matoh, Boštjan Žener, Tomislav Brodar, Ivana Capan, Angelja K. Surca, Hrvoje Kušić, Urška Lavrenčič Štangar, Ana Lončarić Božić

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