Erakusten 1 - 7 emaitzak -- 7 bilaketa honetara 'Tong, V', Bilaketaren denbora: 0,02s
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1
The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements nork Tong, V, Jiang, J, Britton, B
Argitaratua 2015Dataset -
2
The effect of cooling rate and grain size on hydride microstructure in Zircaloy-4 nork Birch, R, Wang, S, Tong, V, Britton, T
Argitaratua 2018Journal article -
3
The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. nork Tong, V, Jiang, J, Wilkinson, A, Britton, T
Argitaratua 2015Journal article -
4
Rapid electron backscatter diffraction mapping: painting by numbers nork Tong, V, Knowles, A, Dye, D, Britton, T
Argitaratua 2018Journal article -
5
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD) nork Koko, A, Tong, V, Wilkinson, AJ, Marrow, TJ
Argitaratua 2023Journal article -
6
AstroEBSD: exploring new space in pattern indexing with methods launched from an astronomical approach nork Britton, T, Tong, V, Hickey, J, Foden, A, Wilkinson, A
Argitaratua 2018Journal article -
7
Picosecond dynamics of a shock-driven displacive phase transformation in Zr nork Swinburne, T, Glavicic, M, Rahman, K, Jones, N, Coakley, J, Eakins, D, White, T, Tong, V, Milathianaki, D, Williams, G, Rugg, D, Sutton, A, Dye, D
Argitaratua 2016Journal article