Näytetään 1 - 7 yhteensä 7 tuloksesta haulle 'Tong, V', hakuaika: 0,02s
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1
The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements Tekijä Tong, V, Jiang, J, Britton, B
Julkaistu 2015Dataset -
2
The effect of cooling rate and grain size on hydride microstructure in Zircaloy-4 Tekijä Birch, R, Wang, S, Tong, V, Britton, T
Julkaistu 2018Journal article -
3
The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. Tekijä Tong, V, Jiang, J, Wilkinson, A, Britton, T
Julkaistu 2015Journal article -
4
Rapid electron backscatter diffraction mapping: painting by numbers Tekijä Tong, V, Knowles, A, Dye, D, Britton, T
Julkaistu 2018Journal article -
5
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD) Tekijä Koko, A, Tong, V, Wilkinson, AJ, Marrow, TJ
Julkaistu 2023Journal article -
6
AstroEBSD: exploring new space in pattern indexing with methods launched from an astronomical approach Tekijä Britton, T, Tong, V, Hickey, J, Foden, A, Wilkinson, A
Julkaistu 2018Journal article -
7
Picosecond dynamics of a shock-driven displacive phase transformation in Zr Tekijä Swinburne, T, Glavicic, M, Rahman, K, Jones, N, Coakley, J, Eakins, D, White, T, Tong, V, Milathianaki, D, Williams, G, Rugg, D, Sutton, A, Dye, D
Julkaistu 2016Journal article