Ցուցադրվում են 1 - 7 արդյունքները 7 այս փնտրման համար 'Tong, V', հարցման ժամանակը: 0.02s
Հստակեցնել արդյունքները
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1
The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements Tong, V, Jiang, J, Britton, B
Հրապարակվել է 2015Dataset -
2
The effect of cooling rate and grain size on hydride microstructure in Zircaloy-4 Birch, R, Wang, S, Tong, V, Britton, T
Հրապարակվել է 2018Journal article -
3
The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. Tong, V, Jiang, J, Wilkinson, A, Britton, T
Հրապարակվել է 2015Journal article -
4
Rapid electron backscatter diffraction mapping: painting by numbers Tong, V, Knowles, A, Dye, D, Britton, T
Հրապարակվել է 2018Journal article -
5
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD) Koko, A, Tong, V, Wilkinson, AJ, Marrow, TJ
Հրապարակվել է 2023Journal article -
6
AstroEBSD: exploring new space in pattern indexing with methods launched from an astronomical approach Britton, T, Tong, V, Hickey, J, Foden, A, Wilkinson, A
Հրապարակվել է 2018Journal article -
7
Picosecond dynamics of a shock-driven displacive phase transformation in Zr Swinburne, T, Glavicic, M, Rahman, K, Jones, N, Coakley, J, Eakins, D, White, T, Tong, V, Milathianaki, D, Williams, G, Rugg, D, Sutton, A, Dye, D
Հրապարակվել է 2016Journal article