Отображение 1 - 7 результаты of 7 для поиска 'Tong, V', время запроса: 0.02сек.
Отмена результатов
-
1
The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements по Tong, V, Jiang, J, Britton, B
Опубликовано 2015Dataset -
2
The effect of cooling rate and grain size on hydride microstructure in Zircaloy-4 по Birch, R, Wang, S, Tong, V, Britton, T
Опубликовано 2018Journal article -
3
The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. по Tong, V, Jiang, J, Wilkinson, A, Britton, T
Опубликовано 2015Journal article -
4
Rapid electron backscatter diffraction mapping: painting by numbers по Tong, V, Knowles, A, Dye, D, Britton, T
Опубликовано 2018Journal article -
5
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD) по Koko, A, Tong, V, Wilkinson, AJ, Marrow, TJ
Опубликовано 2023Journal article -
6
AstroEBSD: exploring new space in pattern indexing with methods launched from an astronomical approach по Britton, T, Tong, V, Hickey, J, Foden, A, Wilkinson, A
Опубликовано 2018Journal article -
7
Picosecond dynamics of a shock-driven displacive phase transformation in Zr по Swinburne, T, Glavicic, M, Rahman, K, Jones, N, Coakley, J, Eakins, D, White, T, Tong, V, Milathianaki, D, Williams, G, Rugg, D, Sutton, A, Dye, D
Опубликовано 2016Journal article