Gösterilen 1 - 7 sonuçlar arası kayıtlar. 7 sonuç. Aranan kelime 'Tong, V', Sorgu süresi: 0.02s
Sonuçları Daraltın
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1
The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements Yazar: Tong, V, Jiang, J, Britton, B
Baskı/Yayın Bilgisi 2015Dataset -
2
The effect of cooling rate and grain size on hydride microstructure in Zircaloy-4 Yazar: Birch, R, Wang, S, Tong, V, Britton, T
Baskı/Yayın Bilgisi 2018Journal article -
3
The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. Yazar: Tong, V, Jiang, J, Wilkinson, A, Britton, T
Baskı/Yayın Bilgisi 2015Journal article -
4
Rapid electron backscatter diffraction mapping: painting by numbers Yazar: Tong, V, Knowles, A, Dye, D, Britton, T
Baskı/Yayın Bilgisi 2018Journal article -
5
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD) Yazar: Koko, A, Tong, V, Wilkinson, AJ, Marrow, TJ
Baskı/Yayın Bilgisi 2023Journal article -
6
AstroEBSD: exploring new space in pattern indexing with methods launched from an astronomical approach Yazar: Britton, T, Tong, V, Hickey, J, Foden, A, Wilkinson, A
Baskı/Yayın Bilgisi 2018Journal article -
7
Picosecond dynamics of a shock-driven displacive phase transformation in Zr Yazar: Swinburne, T, Glavicic, M, Rahman, K, Jones, N, Coakley, J, Eakins, D, White, T, Tong, V, Milathianaki, D, Williams, G, Rugg, D, Sutton, A, Dye, D
Baskı/Yayın Bilgisi 2016Journal article