Đang hiển thị 1 - 7 kết quả của 7 cho tìm kiếm 'Tong, V', thời gian truy vấn: 0.02s
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1
The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements Bằng Tong, V, Jiang, J, Britton, B
Được phát hành 2015Dataset -
2
The effect of cooling rate and grain size on hydride microstructure in Zircaloy-4 Bằng Birch, R, Wang, S, Tong, V, Britton, T
Được phát hành 2018Journal article -
3
The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. Bằng Tong, V, Jiang, J, Wilkinson, A, Britton, T
Được phát hành 2015Journal article -
4
Rapid electron backscatter diffraction mapping: painting by numbers Bằng Tong, V, Knowles, A, Dye, D, Britton, T
Được phát hành 2018Journal article -
5
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD) Bằng Koko, A, Tong, V, Wilkinson, AJ, Marrow, TJ
Được phát hành 2023Journal article -
6
AstroEBSD: exploring new space in pattern indexing with methods launched from an astronomical approach Bằng Britton, T, Tong, V, Hickey, J, Foden, A, Wilkinson, A
Được phát hành 2018Journal article -
7
Picosecond dynamics of a shock-driven displacive phase transformation in Zr Bằng Swinburne, T, Glavicic, M, Rahman, K, Jones, N, Coakley, J, Eakins, D, White, T, Tong, V, Milathianaki, D, Williams, G, Rugg, D, Sutton, A, Dye, D
Được phát hành 2016Journal article