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    X-ray microtomography investigations on the residual pore structure in silicon nitride bars manufactured by direct ink writing using different printing patterns

    X-ray microtomography investigations on the residual pore structure in silicon nitride bars manufactured by direct ink writing using different printing patterns by Sarah Diener, Giorgia Franchin, Nils Achilles, Torben Kuhnt, Felix Rösler, Nikolaos Katsikis, Paolo Colombo

    Published 2021-03-01
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