Introduction by Trager-Cowan, C, Wilkinson, A

Characterisation of epitaxial lateral overgrown GaN by electron backscatter diffraction correlated with cross-sectional cathodoluminescence spectroscopy by Sweeney, F, Trager-Cowan, C, Edwards, P, Wilkinson, A, Watson, I

Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications by Winkelmann, A, Nolze, G, Vespucci, S, Naresh-Kumar-Cowan, G, Trager-Cowan, C, Vilalta-Clementes, A, Wilkinson, A, Vos, M

Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films by Trager-Cowan, C, Sweeney, F, Trimby, P, Day, A, Gholinia, A, Schmidt, N, Parbrook, P, Wilkinson, A, Watson, I

Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging by Trager-Cowan, C, Sweeney, F, Wilkinson, A, Trimby, P, Day, A, Gholinia, A, Schmidt, N, Parbrook, P, Watson, I

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction by Naresh-Kumar, G, Vilalta-Clemente, A, Jussila, H, Winkelmann, A, Nolze, G, Vespucci, S, Nagarajan, S, Wilkinson, A, Trager-Cowan, C

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin fi... by Wilkinson, A, Vilalta-Clemente, A, Naresh-Kumar, G, Nouf-Allehiani, M, Gamarra, P, di Forte-Poisson, M, Trager-Cowan, C

Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope. by Naresh-Kumar, G, Hourahine, B, Edwards, P, Day, A, Winkelmann, A, Wilkinson, A, Parbrook, P, England, G, Trager-Cowan, C

Determination of the structural and luminescence properties of nitrides using electron backscattered diffraction and photo- and cathodoluminescence by Trager-Cowan, C, Sweeney, F, Wilkinson, A, Watson, I, Middleton, P, O'Donnell, K, Zubia, D, Hersee, S, Einfeldt, S, Hommel, D

Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging by Trager-Cowan, C, Sweeney, F, Winkelmann, A, Wilkinson, A, Trimby, P, Day, A, Gholinia, A, Schmidt, N, Parbrook, P, Watson, I

High-resolution electron backscatter diffraction in III-nitride semiconductors by Vilalta-Clemente, A, Naresh-Kumar, G, Nouf Allehiani, M, Parbrook, P, Boulbar, E, Allsopp, D, Shields, P, Trager-Cowan, C, Wilkinson, A

Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films by Trager-Cowan, C, Edwards, P, Dynowski, F, Sweeney, F, Wilkinson, A, Winkelmann, A, Day, A, Wang, T, Parbrook, P, Watson, I, Joy, D

Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light-electron microscopy by Naresh-Kumar, G, Edwards, PR, Batten, T, Nouf-Allehiani, M, Vilalta-Clemente, A, Wilkinson, AJ, Le Boulbar, E, Shields, PA, Starosta, B, Hourahine, B, Martin, RW, Trager-Cowan, C