Showing 1 - 13 results of 13 for search 'Trager-Cowan, C', सवाल का समय: 0.03सेकंड
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Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films द्वारा Trager-Cowan, C, Sweeney, F, Trimby, P, Day, A, Gholinia, A, Schmidt, N, Parbrook, P, Wilkinson, A, Watson, I
प्रकाशित 2007Journal article -
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Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging द्वारा Trager-Cowan, C, Sweeney, F, Wilkinson, A, Trimby, P, Day, A, Gholinia, A, Schmidt, N, Parbrook, P, Watson, I
प्रकाशित 2006Journal article -
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Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin fi... द्वारा Wilkinson, A, Vilalta-Clemente, A, Naresh-Kumar, G, Nouf-Allehiani, M, Gamarra, P, di Forte-Poisson, M, Trager-Cowan, C
प्रकाशित 2016Journal article -
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Determination of the structural and luminescence properties of nitrides using electron backscattered diffraction and photo- and cathodoluminescence द्वारा Trager-Cowan, C, Sweeney, F, Wilkinson, A, Watson, I, Middleton, P, O'Donnell, K, Zubia, D, Hersee, S, Einfeldt, S, Hommel, D
प्रकाशित 2002Journal article -
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Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging द्वारा Trager-Cowan, C, Sweeney, F, Winkelmann, A, Wilkinson, A, Trimby, P, Day, A, Gholinia, A, Schmidt, N, Parbrook, P, Watson, I
प्रकाशित 2006Journal article -
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High-resolution electron backscatter diffraction in III-nitride semiconductors द्वारा Vilalta-Clemente, A, Naresh-Kumar, G, Nouf Allehiani, M, Parbrook, P, Boulbar, E, Allsopp, D, Shields, P, Trager-Cowan, C, Wilkinson, A
प्रकाशित 2015Conference item -
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Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films द्वारा Trager-Cowan, C, Edwards, P, Dynowski, F, Sweeney, F, Wilkinson, A, Winkelmann, A, Day, A, Wang, T, Parbrook, P, Watson, I, Joy, D
प्रकाशित 2008Journal article -
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Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light-electron microscopy द्वारा Naresh-Kumar, G, Edwards, PR, Batten, T, Nouf-Allehiani, M, Vilalta-Clemente, A, Wilkinson, AJ, Le Boulbar, E, Shields, PA, Starosta, B, Hourahine, B, Martin, RW, Trager-Cowan, C
प्रकाशित 2022Journal article