Showing 1 - 4 results of 4 for search 'Tung, Zhi Yan', query time: 0.04s Refine Results
  1. 1
    Electrical characterization of the novel vertical slit field-effect transistor (VeSFET)

    Electrical characterization of the novel vertical slit field-effect transistor (VeSFET) by Tung, Zhi Yan.

    Published 2012
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    Final Year Project (FYP)
  2. 2
    Bias temperature instability study on switching defects in SiON and high-K gate dielectrics

    Bias temperature instability study on switching defects in SiON and high-K gate dielectrics by Tung, Zhi Yan

    Published 2019
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    Thesis
  3. 3
    Impact of voltage-accelerated stress on hole trapping at operating condition

    Impact of voltage-accelerated stress on hole trapping at operating condition by Tung, Zhi Yan, Ang, Diing Shenp

    Published 2018
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    Journal Article
  4. 4
    New observations on the correlation between hole-trapping transformation and SILC generation under NBTI stressing

    New observations on the correlation between hole-trapping transformation and SILC generation under NBTI stressing by Boo, Ann Ann, Tung, Zhi Yan, Ang, Diing Shenp

    Published 2018
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    Journal Article

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