ULSI semiconductor technology atlas / by Tung, Chih-Hang, 1963-, Sheng, George T. T., Lu, Chih-Yuan, 1950-

Room-temperature continuous-wave operation of GaInNAs/GaAs quantum dot laser with GaAsN barrier grown by solid source molecular beam epitaxy by Sun, Z. Z., Yoon, Soon Fatt, Yew, K. C., Bo, B. X., Yan, Du An, Tung, Chih-Hang

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Pyramidal structural defects in erbium silicide thin films by Srolovitz, David J., Tan, Eu Jin, Bouville, Mathieu, Chi, Dong Zhi, Pey, Kin Leong, Lee, Pooi See, Tung, Chih Hang

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Silicide formation from laser thermal processing of Ti/Co bilayers by Chow, F. L., Pey, Kin Leong, Lee, Pooi See, Tung, Chih Hang, Wang, X. C., Lim, G. C., Chong, Y. F.

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Multiple-pulse laser thermal annealing for the formation of Co-silicided junction by Lee, Pooi See, Pey, Kin Leong, Chow, F. L., Tang, L. J., Tung, Chih Hang, Wang, X. C., Lim, G. C.

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Role of low temperature rapid thermal annealing in post-laser-annealed p-channel metal-oxide-semiconductor field effect transistor by Ong, K. K., Pey, Kin Leong, Lee, Pooi See, Wee, A. T. S., Wang, X. C., Tung, Chih Hang, Tang, L. J., Chong, Y. F.

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Pulse electroplating of copper film : a study of process and microstructure by Zhang, X., Tu, K. N., Chen, Z., Tan, Y. K., Wong, Chee C., Mhaisalkar, Subodh Gautam, Li, X. M., Tung, Chih Hang, Cheng, C. K.

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Charge trapping and retention behaviors of Ge nanocrystals distributed in the gate oxide near the gate synthesized by low-energy ion implantation by Yang, Ming, Chen, Tupei, Wong, Jen It, Ng, Chi Yung, Liu, Yang, Ding, Liang, Fung, Stevenson Hon Yuen, Trigg, Alastair David, Tung, Chih Hang, Li, Chang Ming

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Dielectric functions of densely stacked Si nanocrystal layer embedded in SiO2 thin films by Ding, Liang, Chen, Tupei, Wong, Jen It, Yang, Ming, Liu, Yang, Ng, Chi Yung, Liu, Yu Chan, Tung, Chih Hang, Trigg, Alastair David, Fung, Stevenson Hon Yuen

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GaInNAs double-barrier quantum well infrared photodetector with the photodetection at 1.24 μm by Ma, B. S., Fan, Weijun, Dang, Y. X., Cheah, Weng Kwong, Loke, Wan Khai, Liu, W., Li, D. S., Yoon, Soon Fatt, Zhang, Dao Hua, Wang, H., Tung, Chih Hang

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Physical analysis on ultrathin gate dielectric breakdown using TEM by Tang, Lei Jun

Other Authors: “…Tung Chih Hang…”
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Study of breakdown in ultrathin gate dielectrics in nanoscale MOSFETs by Lo, Vui Lip

Other Authors: “…Tung Chih Hang…”
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