Showing 1 - 4 results of 4 for search 'Ullrich Pietsch', query time: 0.03s Refine Results
  1. 1
    Determination of the stacking fault density in highly defective single GaAs nanowires by means of coherent diffraction imaging

    Determination of the stacking fault density in highly defective single GaAs nanowires by means of coherent diffraction imaging by Arman Davtyan, Andreas Biermanns, Otmar Loffeld, Ullrich Pietsch

    Published 2016-01-01
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  2. 2
    Cyclic Deformation Induced Residual Stress Evolution and 3D Short Fatigue Crack Growth Investigated by Advanced Synchrotron Tomography Techniques

    Cyclic Deformation Induced Residual Stress Evolution and 3D Short Fatigue Crack Growth Investigated by Advanced Synchrotron Tomography Techniques by Benjamin Dönges, Melanie Syha, Anne K. Hüsecken, Ullrich Pietsch, Wolfgang Ludwig, Ulrich Krupp, Hans-Jürgen Christ

    Published 2021-03-01
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  3. 3
    Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements

    Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements by Eduard Mikayelyan, Linda Grodd, Viachaslau Ksianzou, Daniel Wesner, Alexander I. Rodygin, Holger Schönherr, Yuriy N. Luponosov, Sergei A. Ponomarenko, Dimitri A. Ivanov, Ullrich Pietsch, Souren Grigorian

    Published 2019-05-01
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  4. 4
    Electrically driven transient and permanent phase transformations in highly strained epitaxial BiFeO3 thin films

    Electrically driven transient and permanent phase transformations in highly strained epitaxial BiFeO3 thin films by Hyeon Jun Lee, Jeongyong Kim, Seung Hyun Hwang, Hyeokmin Choe, Semen Gorfman, Yeong-Jae Heo, Su Yong Lee, Pierre-Eymeric Janolin, Igor Kornev, Tobias U. Schülli, Carsten Richter, Joo-Hyoung Lee, Ullrich Pietsch, Chan-Ho Yang, Ji Young Jo

    Published 2020-10-01
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