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Defect Profiling of Oxide‐Semiconductor Interfaces Using Low‐Energy Muons by Maria Mendes Martins, Piyush Kumar, Judith Woerle, Xiaojie Ni, Ulrike Grossner, Thomas Prokscha
Published 2023-07-01
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The role of boron related defects in limiting charge carrier lifetime in 4H–SiC epitaxial layers by Misagh Ghezellou, Piyush Kumar, Marianne E. Bathen, Robert Karsthof, Einar Ö. Sveinbjörnsson, Ulrike Grossner, J. Peder Bergman, Lasse Vines, Jawad Ul-Hassan
Published 2023-03-01
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