A Computational Study on the Variation of Bandgap Due to Native Defects in Non-Stoichiometric NiO and Pd, Pt Doping in Stoichiometric NiO by Srikanth Itapu, Vamsi Borra, Faramarz Mossayebi

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Building Trust in Microelectronics: A Comprehensive Review of Current Techniques and Adoption Challenges by Kwame Nyako, Suman Devkota, Frank Li, Vamsi Borra

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Tin Whisker Growth Suppression Using NiO Sublayers Fabricated by Dip Coating by Jacob D. Buchanan, Vamsi Borra, Md Maidul Islam, Daniel G. Georgiev, Srikanth Itapu

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A Novel Modal Representation of Battery Dynamics by Khaled I. Alsharif, Alexander H. Pesch, Vamsi Borra, Frank X. Li, Pedro Cortes, Eric Macdonald, Kyosung Choo

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A Coupled Thermo-Mechanical Dynamic Characterization of Cylindrical Batteries by Khaled I. Alsharif, Alexander H. Pesch, Vamsi Borra, Frank X. Li, Pedro Cortes, Eric Macdonald, Kyosung Choo

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