Tussen norm en praktijk. Een terreinverkenning over het juridische statuut van vrouwen in het zestiende-eeuwse Antwerpen by Laura van Aert

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The Beagle Conflict by Peter van Aert

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Tussen norm en praktijk. Een terreinverkenning over het juridische statuut van vrouwen in het zestiende-eeuwse Antwerpen by Laura van Aert

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Tussen norm en praktijk. Een terreinverkenning over het juridische statuut van vrouwen in het zestiende-eeuwse Antwerpen by Laura van Aert

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The Beagle conflict by Peter van Aert

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Deep convolutional neural networks to restore single-shot electron microscopy images by I. Lobato, T. Friedrich, S. Van Aert

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Migración e identidad: el caso de Tierra del Fuego by Mariano Hermida, Mariano Malizia, Peter Van Aert

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Advanced three-dimensional electron microscopy techniques in the quest for better structural and functional materials by D Schryvers, S Cao, W Tirry, H Idrissi and S Van Aert

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Effect of amorphous layers on the interpretation of restored exit waves. by Van Aert, S, Chang, L, Bals, S, Kirkland, A, Van Tendeloo, G

Effect of amorphous layers on the interpretation of restored exit waves by Van Aert, S, Chang, L, Bals, S, Kirkland, A, Van Tendeloo, G

Research Into Evidence-Based Psychological Interventions Needs a Stronger Focus on Replicability by Helen Niemeyer, Christine Knaevelsrud, Robbie C. M. van Aert, Thomas Ehring

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Bayesian evaluation of effect size after replicating an original study. by Robbie C M van Aert, Marcel A L M van Assen

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Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions by Zhang, Z, Lobato, I, De Backer, A, Van Aert, S, Nellist, P

Hybrid statistics-simulations based method for atom-counting from ADF STEM images by De wael, A, De Backer, A, Jones, L, Nellist, P, Van Aert, S

Measuring dynamic structural changes of nanoparticles at the atomic scale using scanning transmission electron microscopy by De Wael, A, Annick, Jones, L, Varambhia, A, Nellist, PD, Van Aert, S

Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy by Martinez, G, Van Den Bos, K, Alania, M, Nellist, P, Van Aert, S

The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials by Van Den Bos, K, Janssens, L, De Backer, A, Nellist, P, Van Aert, S

Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm by De Backer, A, Van Aert, S, Faes, C, Irmak, EA, Nellist, PD, Jones, L

Control of knock-on damage for 3D atomic scale quantification of nanostructures: Making every electron count in scanning transmission electron microscopy by Van Aert, S, De Backer, A, Jones, L, Martinez, G, Béché, A, Nellist, P

Publication bias examined in meta-analyses from psychology and medicine: A meta-meta-analysis. by Robbie C M van Aert, Jelte M Wicherts, Marcel A L M van Assen

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