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Degradation process in Tl2Ba2Ca1Cu2O10+x by Vernon-Parry, K, Romano, LT, Lees, J, Grovenor, C
Published 1990Journal article -
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High resolution deep level transient spectroscopy applied to extended defects in silicon by Evans-Freeman, J, Emiroglu, D, Vernon-Parry, K, Murphy, J, Wilshaw, P
Published 2005Conference item