Thermal and Structural Analysis of FIMS Grating by K.-I. Seon, I.-S. Yuk, K.-S. Ryu, J.-H. Park, K. Kang, H. Jin, U.-W. Nam, W. Han, K.-W. Min, W.-B. Lee, J. Edelstein, E. Korpela

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Exposure Time Analysis for Far-Ultraviolet Imaging Spectrograph All-Sky Survey Mission by J.-H. Park, K.-I. Seon, K.-S. Ryu, I.-S. Yuk, H. Jin, D.-H. Lee, S.-H. Oh, J. Seon, U.-W. Nam, W. Han, W.-B. Lee, K.-W, Min, J. Edelstein, E. J. Korpela

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Error Budget Analysis of FIMS Optical System by K.-I. Seon, I.-S. Yuk, K.-S. Ryu, J.-H. Park, H. Jin, J.-H. Seon, S.-H. Oh, J.-G. Rhee, D.-H. Lee, U.-W. Nam, W. Han, K.-W, Min, W.-B. Lee, J. Edelstein, E. Korpela

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High Resolution Delay Line Readout Electronics for the FIMS 2-D Position Sensitive Detector by J. G. Rhee, U. W. Nam, K. N. Kong, D. H. Lee, J. H. Shin, I. S. Yuk, H. Jin, K. S. Ryu, K. I. Seon, K. I. Kang, J. H. Park, K. W. Min, W. Y. Han, W. B. Lee, E. korpela, J. Edelstein

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