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Walter Schwarzenbach
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Impact of Channel Thickness on the NBTI Behaviors in the Ge-OI pMOSFETs With Al<sub>2</sub>O<sub>3</sub>/GeO<sub>x</sub> Gate Stacks
by
Yu Sun
,
Walter Schwarzenbach
,
Sicong Yuan
,
Zhuo Chen
,
Yanbin Yang
,
Bich-Yen Nguyen
,
Dawei Gao
,
Rui Zhang
Published 2023-01-01
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