Dielectric reliability in high-voltage GaN metal-insulator-semiconductor high electron mobility transistors حسب Warnock, Shireen M

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A ballistic transport model for HEMTs and III-V MOSFETs حسب Warnock, Shireen M

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Time-Dependent Dielectric Breakdown in High-Voltage GaN MIS-HEMTs: The Role of Temperature حسب Warnock, Shireen M., Lemus, Allison, Joh, Jungwoo, Krishnan, Srikanth, Pendharkar, Sameer, del Alamo, Jesus A

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Progress Toward Diamond Power Field-Effect Transistors حسب Geis, Michael W., Wade, Travis C., Wuorio, Charles H., Fedynyshyn, Theodore H., Duncan, Bradley, Plaut, Maxwell E., Varghese, Joseph O., Warnock, Shireen M., Vitale, Steven A., Hollis, Mark A.

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