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    Enhancement noise margin and delay time performance of novel punch-through nMOS for single-carrier CMOS

    Enhancement noise margin and delay time performance of novel punch-through nMOS for single-carrier CMOS מאת Jyi-Tsong Lin, Pei-Zhang Xie, Wei-Han Lee

    יצא לאור 2024-07-01
    קבל טקסט מלא
    Article

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