Xiaoqing Wen

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Xiaoqing Wen from the Kyushu Institute of Technology, Iizuka, Fukuoka, Japan was named Fellow of the Institute of Electrical and Electronics Engineers (IEEE) in 2012 ''for contributions to testing of integrated circuits''. Provided by Wikipedia
Showing 1 - 3 results of 3 for search 'Wen, Xiaoqing', query time: 0.03s Refine Results
  1. 1
    VLSI test principles and architectures : design for testability /

    VLSI test principles and architectures : design for testability / by Wang, Laung-Terng, Wu, Cheng-Wen, EE Ph. D., Wen, Xiaoqing

    Published 2006
  2. 2
    Fault detection with optimum March Test Algorithm

    Fault detection with optimum March Test Algorithm by Zakaria, Nor Azura, Wan Hasan, Wan Zuha, Abdul Halin, Izhal, Mohd Sidek, Roslina, Wen, Xiaoqing

    Published 2012
    Conference or Workshop Item
  3. 3
    Testing static single cell faults using static and dynamic data background

    Testing static single cell faults using static and dynamic data background by Zakaria, Nor Azura, Wan Hasan, Wan Zuha, Abdul Halin, Izhal, Mohd Sidek, Roslina, Wen, Xiaoqing

    Published 2011
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    Conference or Workshop Item

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