Investor regret: The role of expectation in comparing what is to what might have been by Wen-Hsien Huang, Marcel Zeelenberg

Get full text

Investor regret: The role of expectation in comparing what is to what might have been by Wen-Hsien Huang, Marcel Zeelenberg

Get full text

Design on Formation of Nickel Silicide by a Low‐Temperature Pulsed Laser Annealing Method to Reduce Contact Resistance for CMOS Inverter and 6T‐SRAM on a Wafer‐Scale Flexible Subst... by Yu‐Chieh Hsu, Yan‐Yu Chen, Jia‐Min Shieh, Wen‐Hsien Huang, Chang‐Hong Shen, Yu‐Lun Chueh

Get full text

Improving the High-Temperature Gate Bias Instabilities by a Low Thermal Budget Gate-First Process in p-GaN Gate HEMTs by Catherine Langpoklakpam, An-Chen Liu, Neng-Jie You, Ming-Hsuan Kao, Wen-Hsien Huang, Chang-Hong Shen, Jerry Tzou, Hao-Chung Kuo, Jia-Min Shieh

Get full text

High Performance and Low power Monolithic Three-Dimensional Sub-50 nm Poly Si Thin film transistor (TFTs) Circuits by Tsung-Ta Wu, Wen-Hsien Huang, Chih-Chao Yang, Hung-Chun Chen, Tung-Ying Hsieh, Wei-Sheng Lin, Ming-Hsuan Kao, Chiu-Hao Chen, Jie-Yi Yao, Yi-Ling Jian, Chiung-Chih Hsu, Kun-Lin Lin, Chang-Hong Shen, Yu-Lun Chueh, Jia-Min Shieh

Get full text