THE EXPERIMENTAL REQUIREMENTS FOR QUANTITATIVE MEASUREMENT OF CARRIER RECOMBINATION AT DEFECTS IN SEMICONDUCTORS USING THE EBIC TECHNIQUE by Wilshaw, P

QUANTITATIVE EBIC INVESTIGATIONS OF DEFORMATION-INDUCED AND COPPER DECORATED DISLOCATIONS IN SILICON by Fell, T, Wilshaw, P

RECOMBINATION AT DISLOCATIONS IN THE DEPLETION REGION IN SILICON by Fell, T, Wilshaw, P

THE ELECTRONIC-PROPERTIES OF DISLOCATIONS IN SILICON by Wilshaw, P, Fell, T

THE ELECTRONIC-PROPERTIES OF DISLOCATIONS IN SILICON by Wilshaw, P, Fell, T

Electron beam induced current investigations of transition metal impurities at extended defects in silicon by Wilshaw, P, Fell, T

RECOMBINATION AT DISLOCATIONS IN THE DEPLETION REGION IN SILICON by Fell, T, Wilshaw, P

THE EFFECT OF DIFFERENT TRANSITION-METALS ON THE RECOMBINATION EFFICIENCY OF DISLOCATIONS by Fell, T, Wilshaw, P

QUANTITATIVE EBIC INVESTIGATIONS OF DEFORMATION-INDUCED AND COPPER DECORATED DISLOCATIONS IN SILICON by Fell, T, Wilshaw, P

EMISSION CHARACTERISTICS AND MORPHOLOGY OF WET ETCHED CATHODES IN P-TYPE SILICON by Boswell, E, Wilshaw, P

Data for Corona field effect surface passivation of n-type IBC cells by Bonilla, R, Wilshaw, P

Data for Corona charge in SiO2: kinetics and surface passivation for high efficiency silicon solar cells by Bonilla, R, Wilshaw, P

Data for Potassium ions in SiO2: electrets for silicon surface passivation by Bonilla, R, Wilshaw, P

Field emission from pyramidal cathodes covered in porous silicon by Wilshaw, P, Boswell, E

Data for 'Extremely low surface recombination in 1 Ωcm n-type monocrystalline silicon' by Bonilla, R, Wilshaw, P

NEW RESULTS AND AN INTERPRETATION FOR SEM EBIC CONTRAST ARISING FROM INDIVIDUAL DISLOCATIONS IN SILICON. by Wilshaw, P, Booker, G

Data for Effective antireflection and surface passivation of silicon using a SiO2/a-TiOx film stack by Bonilla, R, Wilshaw, P

Getting connected - Improved bone implant interfaces by Wilshaw, P, Adams, R

Stable field effect surface passivation of n-type Cz silicon by Bonilla, R, Wilshaw, P

A technique for field effect surface passivation for silicon solar cells by Bonilla, R, Wilshaw, P