Tutorial: crystal orientations and EBSD – or which way is up? by Wilkinson, A, Britton, T, Jiang, J, Guo, Y, Vilalta-Clemente, A, Wallis, D, Hansen, L, Winkelmann, A

Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy. by Schäfer, N, Wilkinson, A, Schmid, T, Winkelmann, A, Chahine, G, Schülli, T, Rissom, T, Marquardt, J, Schorr, S, Abou-Ras, D

Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications by Winkelmann, A, Nolze, G, Vespucci, S, Naresh-Kumar-Cowan, G, Trager-Cowan, C, Vilalta-Clementes, A, Wilkinson, A, Vos, M

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction by Naresh-Kumar, G, Vilalta-Clemente, A, Jussila, H, Winkelmann, A, Nolze, G, Vespucci, S, Nagarajan, S, Wilkinson, A, Trager-Cowan, C

Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope. by Naresh-Kumar, G, Hourahine, B, Edwards, P, Day, A, Winkelmann, A, Wilkinson, A, Parbrook, P, England, G, Trager-Cowan, C

Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging by Trager-Cowan, C, Sweeney, F, Winkelmann, A, Wilkinson, A, Trimby, P, Day, A, Gholinia, A, Schmidt, N, Parbrook, P, Watson, I

Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films by Trager-Cowan, C, Edwards, P, Dynowski, F, Sweeney, F, Wilkinson, A, Winkelmann, A, Day, A, Wang, T, Parbrook, P, Watson, I, Joy, D