Discrete-Trap Effects on 3-D NAND Variability – Part II: Random Telegraph Noise by Gerardo Malavena, Salvatore M. Amoroso, Andrew R. Brown, Plamen Asenov, Xi-Wei Lin, Victor Moroz, Mattia Giulianini, David Refaldi, Christian Monzio Compagnoni, Alessandro S. Spinelli

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Discrete-Trap Effects on 3-D NAND Variability – Part I: Threshold Voltage by Gerardo Malavena, Salvatore M. Amoroso, Andrew R. Brown, Plamen Asenov, Xi-Wei Lin, Victor Moroz, Mattia Giulianini, David Refaldi, Christian Monzio Compagnoni, Alessandro S. Spinelli

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Enabling Variability-Aware Design-Technology Co-Optimization for Advanced Memory Technologies by Salvatore M. Amoroso, Plamen Asenov, Jaehyun Lee, Nara Kim, Ko-Hsin Lee, Yaohua Tan, Yong-Seog Oh, Lee Smith, Xi-Wei Lin, Victor Moroz

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