Showing 1 - 6 results of 6 for search 'Yang Shao-Ming', query time: 0.03s
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Analysis of Anti-JFET for 600V VDMOS and HCI Reliability by Yang Shao-Ming, Sheu Gene, Lai Chiu-Chung, Deivasigamani Ravi
Published 2018-01-01
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Gate Engineering in SOI LDMOS for Device Reliability by Aanand, Sheu Gene, Imam Syed Sarwar, Lu Shao Wei, Aryadeep Chirag, Yang Shao Ming
Published 2016-01-01
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Sensitivity Study of Polysilicon Nanowire Based on Scattering and Quantum Mechanics Models by Aanand, Sheu Gene, Imam Syed Sarwar, Lu Shao Wei, Yang Shao-Ming, Fan Ming Jen
Published 2018-01-01
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Study of HCI Reliability for PLDMOS by Deivasigamani Ravi, Sheu Gene, Aanand, Wei Lu Shao, Sarwar Imam Syed, Lai Chiu-Chung, Yang Shao-Ming
Published 2018-01-01
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