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Investigation of Surface Defects in Optical Components Based on Reflection Mueller Matrix Spectroscopy by Ruyi Li, Feibin Wu, Huiling Huang, Weibin Cai, Yantong Zhang, Jun Han
Published 2023-08-01
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Imaging through a Scattering Medium under Different Intensities of Ambient Light Interference by Yantong Zhang, Huiling Huang, Feibin Wu, Jun Han, Yi Yang, Ruyi Li
Published 2023-09-01
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