Attenuation in Rectangular Waveguides with Finite Conductivity Walls par Yeap, K, Tham, C, Yassin, G, Yeong, K

Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging par Song, X, Yeap, K, Zhu, J, Belnoue, J, Sebastiani, M, Bemporad, E, Zeng, K, Korsunsky, A

Residual stress measurement in thin films using the semi-destructive ring-core drilling method using Focused Ion Beam par Song, X, Yeap, K, Zhu, J, Belnoue, J, Sebastiani, M, Bemporad, E, Zeng, K, Korsunsky, A

Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging par Song, X, Yeap, K, Zhu, J, Belnoue, J, Sebastiani, M, Bemporad, E, Zeng, K, Korsunsky, A