Showing 1 - 1 results of 1 for search 'Yeo, Benjamin Jin Soon.', query time: 0.02s Refine Results
  1. 1
    Non-destructive analysis of microelectronic packages using computer x-ray tomography

    Non-destructive analysis of microelectronic packages using computer x-ray tomography by Yeo, Benjamin Jin Soon.

    Published 2008
    Get full text
    Research Report

Search Tools: