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Impact of Various Thermistors on the Properties of Resistive Microbolometers Fabricated by CMOS Process by Yaozu Guo, Haolan Ma, Jiang Lan, Yiming Liao, Xiaoli Ji
Published 2022-10-01
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Degradation Prediction of GaN HEMTs under Hot-Electron Stress Based on ML-TCAD Approach by Ke Wang, Haodong Jiang, Yiming Liao, Yue Xu, Feng Yan, Xiaoli Ji
Published 2022-11-01
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