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Fabrication of Large-Area Mullite–Cordierite Composite Substrates for Semiconductor Probe Cards and Enhancement of Their Reliability by Da-Eun Hyun, Jwa-Bin Jeon, Yeon-Sook Lee, Yong-Nam Kim, Minkyung Kim, Seunghoon Ko, Sang-Mo Koo, Weon Ho Shin, Chulhwan Park, Dong-Won Lee, Jong-Min Oh
Published 2022-06-01
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