Challenges of an optical pressure standard in medium vacuum measurements by Yoshinori Takei, Souichi Telada, Hajime Yoshida, Youichi Bitou, Tokihiko Kobata

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Towards medium vacuum measurements using an optical pressure standard by Yoshinori Takei, Souichi Telada, Hajime Yoshida, Youichi Bitou, Tokihiko Kobata

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Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level by Yassir Arezki, Rong Su, Ville Heikkinen, François Leprete, Pavel Posta, Youichi Bitou, Christian Schober, Charyar Mehdi-Souzani, Bandar Abdulrahman Mohammed Alzahrani, Xiangchao Zhang, Yohan Kondo, Christof Pruss, Vit Ledl, Nabil Anwer, Mohamed Lamjed Bouazizi, Richard Leach, Hichem Nouira

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