Root-cause analysis and characterization of oxygen-related defects in silicon PV material : an approach from macro to nanoscale por Youssef, Amanda.

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Three-dimensional defect characterization : focused ion beam tomography applied to tin sulfide thin films por Youssef, Amanda

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Using Atom-Probe Tomography to Understand ZnO∶Al=SiO[subscript 2]=Si Schottky Diodes por Schoofs, Frank, Ramanathan, Shriram, Jaramillo, Rafael, Youssef, Amanda, Akey, Austin J, Buonassisi, Anthony

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Tabula Rasaforn-Cz silicon-based photovoltaics por LaSalvia, Vincenzo, Youssef, Amanda, Jensen, Mallory Ann, Looney, Erin E., Nemeth, William, Page, Matthew, Nam, Wooseok, Buonassisi, Anthony, Stradins, Paul

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Solar Cell Efficiency and High Temperature Processing of n-type Silicon Grown by the Noncontact Crucible Method por LaSalvia, Vincenzo, Morishige, Ashley E., Nakajima, Kazuo, Veschetti, Yannick, Jay, Frederic, Jouini, Anis, Stradins, Paul, Jensen, Mallory Ann, Morishige, Ashley Elizabeth, Youssef, Amanda, Buonassisi, Anthony

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Distribution and Charge State of Iron Impurities in Intentionally Contaminated Lead Halide Perovskites por Rose, Volker, Lai, Barry, Cai, Zhonghou, Poindexter, Jeremy Roger, Jensen, Mallory Ann, Morishige, Ashley Elizabeth, Looney, Erin Elizabeth, Youssef, Amanda, Correa-Baena, Juan-Pablo, Wieghold, Sarah, Buonassisi, Anthony

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