Showing 1 - 4 results of 4 for search 'Yuen, Edmund', query time: 0.05s Refine Results
  1. 1
    Effect of image compression using fast fourier transformation and discrete wavelet transformation on transfer learning wafer defect image classification

    Effect of image compression using fast fourier transformation and discrete wavelet transformation on transfer learning wafer defect image classification by Jessnor Arif, Mat Jizat, Ahmad Fakhri, Ab. Nasir, Anwar P. P., Abdul Majeed, Yuen, Edmund

    Published 2020
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    Article
  2. 2
    Evaluation of the machine learning classifier in wafer defects classification

    Evaluation of the machine learning classifier in wafer defects classification by Jessnor Arif, Mat Jizat, Anwar, P. P. Abdul Majeed, Ahmad Fakhri, Ab. Nasir, Zahari, Taha, Yuen, Edmund

    Published 2021
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    Article
  3. 3
    Evaluation of the Transfer Learning Models in Wafer Defects Classification

    Evaluation of the Transfer Learning Models in Wafer Defects Classification by Jessnor Arif, Mat Jizat, Anwar, P. P. Abdul Majeed, Ahmad Fakhri, Ab. Nasir, Zahari, Taha, Yuen, Edmund, Lim, Shi Xuen

    Published 2022
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    Conference or Workshop Item
  4. 4
    The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation

    The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation by Ismail, Mohd Khairuddin, Lim, Shi Xuen, Mohd Azraai, Mohd Razman, Jessnor Arif, Mat Jizat, Yuen, Edmund, Jiang, Haochuan, Yap, Eng Hwa, Anwar, P. P. Abdul Majeed

    Published 2023
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    Conference or Workshop Item

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