Optical characterization of point defects on internal quantum efficiency in AlGaN quantum wells grown on face-to-face-annealed sputtered AlN templates by Satoshi Kurai, Megumi Fujii, Yuta Ohnishi, Ryota Oshimura, Kosuke Inai, Kunio Himeno, Narihito Okada, Kenjiro Uesugi, Hideto Miyake, Yoichi Yamada

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