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Atomic-scale 3D imaging of individual dopant atoms in an oxide semiconductor by K. A. Hunnestad, C. Hatzoglou, Z. M. Khalid, P. E. Vullum, Z. Yan, E. Bourret, A. T. J. van Helvoort, S. M. Selbach, D. Meier
Published 2022-08-01
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