The design and testing of integrated circuits for submillimeter-wave spectroscopy by Zamdmer, Noah

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Hot-electron degradation of bipolar transistors by Zamdmer, Noah

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High-Frequency (>100 GHz) and High-Speed (<10 ps) Electronic Devices by Hu, Qing, de Lange, Gerhard, Rahman, Arifur, Duerr, Erik K., Konistis, Kostantinas, Sollner, Gerry, Lichtenberger, Arthur, Robertazzi, Ray, Verghese, Simon, Zamdmer, Noah D., Rana, Farhan, Melloch, Michael R., Rooks, Michael J., Xu, Bin, Riely, Brian P., Williams, Benjamin S., Lyubomirsky, Ilya, Streetman, Ben

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High-Frequency (> 100 GHz) and High-Speed (< 10 ps) Electronic Devices by Hu, Qing, de Lange, Gerhard, Rahman, Arifur, Duerr, Erik K., Ralston, Richard, Wyss, Rolf A., Rana, Farhan, del Alamo, Jésus A., Melloch, Michael R., Rooks, Michael J., Yakubo, Kou, Feng, Shechao, Verghese, Simon, Schäpers, Thomas, Föster, Arno, Zamdmer, Noah D., Brown, Elliot, Xu, Bin, Lyubomirsky, Ilya, Streetman, Ben

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High-Frequency (>100 GHz) and High-Speed (<1 ps) Electronic Devices by Hu, Qing, de Lange, Gerhard, Jacobson, Brian R., Rahman, Arifur, Ralston, Richard, Group 86 at MIT Lincoln Laboratory, Wyss, Rolf A., del Alamo, Jesús A., Melloch, Michael R., Rooks, Michael J., Yakubo, Kou, Feng, Shechao, Verghese, Simon, Schäpers, Thomas, Zamdmer, Noah D., Brown, Elliot, Ernstmeyer, James, Xu, Bin, Smet, Jergen H., Fonstad, Clifton G., Jr., Lyubomirsky, Ilya

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