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Electron irradiation effects and room-temperature annealing mechanisms for SiC MOSFETs by Mu He, Peng Dong, Yao Ma, Qingkui Yu, Shuang Cao, Wende Huang, Qian Xu, Sijie Zhang, Mingmin Huang, Yun Li, Zhimei Yang, Min Gong
Published 2024-05-01
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