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Nanogoniometry with scanning force microscopy: a model study of CdTe thin films. by Palacios-Lidón, E, Guanter, L, Zúñiga-Pérez, J, Muñoz-Sanjosé, V, Colchero, J
Published 2007Journal article -
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Hard x-ray photoelectron spectroscopy as a probe of the intrinsic electronic properties of CdO by Mudd, J, Lee, T, Munoz-Sanjose, V, Zuniga-Perez, J, Hesp, D, Kahk, J, Payne, D, Egdell, R, McConville, C
Published 2014Journal article