Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy by Martinez, G, Van Den Bos, K, Alania, M, Nellist, P, Van Aert, S

The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials by Van Den Bos, K, Janssens, L, De Backer, A, Nellist, P, Van Aert, S

Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy. by van den Bos, K, De Backer, A, Martinez, G, Winckelmans, N, Bals, S, Nellist, P, Van Aert, S