Problem solving with microbeam analysis /

Problem solving with microbeam analysis /

09

Detalhes bibliográficos
Autor principal:	458668 Kiss, Klara
Formato:
Publicado em:	Amsterdam : Elsevier Science, 1988
Assuntos:	Electron microscopy Microprobe analysis

Registros relacionados

Electron and microscopy and microanalysis ; principles and applications /
por: 184792 Murr, Lawrence E.
Publicado em: (1982)

Electron microprobe analysis/
por: 220228 Reed, S. J. B.
Publicado em: (1975)

Practical scanning electron microscopy /
por: Yakowitz, Harney
Publicado em: (1975)

Microprobe techniques in the earth sciences /
Publicado em: (1995)

X-Ray microanalysis in biology/
por: Hayat, M. A.
Publicado em: (1981)

International Symposium on Microchemical Techniques : Proceedings
por: 8334 International Union of Pure and Applied Chemistry, et al.
Publicado em: (1977)

The proton microprobe : applications in the biomedical field /
por: 418881 Vis, Ronald D.
Publicado em: (1985)

Scanning desorption of small molecules from model biological surfaces.
por: Silver, Bruce (Bruce Richard)
Publicado em: (2024)

An ion microprobe study of trace element partitioning between clinopyroxene and liquid in the diopside (CaMgSi2O6) - albite (NaAlSi3O8) - anorthite (CaAl2Si2O8) system
por: Ray, Glenn Lamar
Publicado em: (2010)

12.141 Electron Microprobe Analysis, January (IAP) 2003
por: Chatterjee, Nilanjan, et al.
Publicado em: (2003)

MinPlotX: A powerful tool for formula recalculation, visualization, and comparison of large mineral compositional datasets
por: Walters Jesse B., et al.
Publicado em: (2025-02-01)

FAHLORES FROM PORPHYRY Cu-(Mo) DEPOSITS OF THE URALS
por: O.Yu. Plotinskaya, et al.
Publicado em: (2022-09-01)

Adhesion strength of nickel and zinc coatings with copper base electroplated in conditions of external stimulation by laser irradiance
por: V. V. Dudkina
Publicado em: (2013-04-01)

EVALUATION OF THERMAL METAMORPHISM TEMPERATURE OF EQUILIBRATED ORDINARY CHONDRITES
por: К. G. Sukhanova, et al.
Publicado em: (2022-06-01)

Investigation of probing repeatability inside a micro-hole by changing probe approach direction for a local surface interaction force detection type microprobe
por: Masakazu Aruga, et al.
Publicado em: (2023-02-01)

Physical aspects of electron microscopy and microbeam analysis /
por: 233693 Siegel, Benjamin M., et al.
Publicado em: (1975)

Detour-RS: Reroute Attack Vulnerability Assessment with Awareness of the Layout and Resource
por: Minyan Gao, et al.
Publicado em: (2024-04-01)

The Ore-forming Age of the Uranium Mineralization Associated with Precambrian Sedimentary-Metamorphic Iron Deposits in Eastern Liaoning Province and Reliability Analysis of Dating Results
por: Xinyu SUN, et al.
Publicado em: (2023-12-01)

Electron beam specimen interactions /
por: 273613 Dickson, Melvyn
Publicado em: (2001)

Proceedings for 7th Asia Pacific Electron Microscopy Conference, 26-30 June 2000, Singapore International Convention & Exibition Centre, Suntec City, Singapore : perspective imaging
por: Asia Pacific Electron Microscopy Conference (7th : 2000 : Singapore)
Publicado em: (2000)

Persidangan Saintifik Kedua Dan Mesyuarat Agung Tahunan Persatuan Mikroskopi Elektron Malaysia pada 14-15 November 1992 [fotograf]

Use of electron microscopy data in receptor models for PM-10 /
por: 437907 Dzubay, Thomas G., et al.

An introduction to biological electron microscopy /
por: 273613 Dickson, Melvyn
Publicado em: (2001)

Electron microscopy and analysis /
por: 262434 Goodhew, Peter J., et al.
Publicado em: (1988)

Electron microscopy and analysis /
por: 262434 Goodhew, Peter J., et al.
Publicado em: (2001)

Advances in optical and electron microscopy /
por: Mulvey, T., et al.
Publicado em: (1989)

Electron microscopy and analysis, 1971- /
por: 2959 Institute of Physics Electron Microscopy and Analysis Group Conference
Publicado em: (1971)

Electron microscopy and analysis, 1971-
por: Institute of Physics Electron Microscopy and Analysis Group Conference
Publicado em: (1971)

Developments in electron microscopy and analysis /
por: 250459 Venables, J. A.
Publicado em: (1976)

Developments in electron microscopy and analysis, 1977/
por: Misell, D. L.
Publicado em: (1977)

Application of wavelet-analysis for image filtration in electronic and probe microscopy
por: N. P. Konnov, et al.
Publicado em: (2008-06-01)

Analysis and applications of a heralded electron source
por: Stewart A Koppell, et al.
Publicado em: (2025-01-01)

12.119 Analytical Techniques for Studying Environmental and Geologic Samples, Spring 2006
por: Boyle, Edward, et al.
Publicado em: (2006)

Understanding the small world : an insight into the application of transmission electron microscopy in characterizing epitaxial layer /
por: 465403 Zul Azhar Zahid Jamal
Publicado em: (2010)

Size dependent large displacements of microbeams and microframes
por: Cong Ich Le, et al.
Publicado em: (2022-09-01)

Crystal Chemical Analysis of Nd9.33Si6O26 and Nd8Sr2Si6O26 Apatite Electrolytes Using Aberration-Corrected Scanning Transmission Electron Microscopy and Impedance Spectroscopy
por: An, Tao, et al.
Publicado em: (2016)

Holographic microscopy of phase microscopic objects : theory and practice /
por: 523195 Tishko, Tatyana, et al.
Publicado em: (2011)

Defect analysis in electron microscopy /
por: 228370 Loretto, M. H., et al.
Publicado em: (1975)

Automated Detection of Material Defects for High-throughput Electron Micrographs Analysis
por: Durnescu Andrei Tudor, et al.
Publicado em: (2024-01-01)

Scanning and transmission electron microscopy : an introduction /
por: Flegler, Stanley L., et al.
Publicado em: ([199)