Defect analysis in electron microscopy /
42
| Main Authors: | , |
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| Format: | |
| Published: |
London : Chapman and Hall,
1975
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| Subjects: |
| _version_ | 1796666375761035264 |
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| author | 228370 Loretto, M. H. Smallman, R. E. |
| author_facet | 228370 Loretto, M. H. Smallman, R. E. |
| author_sort | 228370 Loretto, M. H. |
| collection | OCEAN |
| description | 42 |
| first_indexed | 2024-03-04T17:45:31Z |
| format | |
| id | KOHA-OAI-TEST:105672 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| last_indexed | 2024-03-04T17:45:31Z |
| publishDate | 1975 |
| publisher | London : Chapman and Hall, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:1056722020-12-19T17:01:41ZDefect analysis in electron microscopy / 228370 Loretto, M. H. Smallman, R. E. London : Chapman and Hall,197542PSZJBLCrystalsElectron microscopyURN:ISBN:047054760X |
| spellingShingle | Crystals Electron microscopy 228370 Loretto, M. H. Smallman, R. E. Defect analysis in electron microscopy / |
| title | Defect analysis in electron microscopy / |
| title_full | Defect analysis in electron microscopy / |
| title_fullStr | Defect analysis in electron microscopy / |
| title_full_unstemmed | Defect analysis in electron microscopy / |
| title_short | Defect analysis in electron microscopy / |
| title_sort | defect analysis in electron microscopy |
| topic | Crystals Electron microscopy |
| work_keys_str_mv | AT 228370lorettomh defectanalysisinelectronmicroscopy AT smallmanre defectanalysisinelectronmicroscopy |