Lifetime in semiconductors : an apparatus for the measurement of carrier liftmen in silicon /

Lifetime in semiconductors : an apparatus for the measurement of carrier liftmen in silicon /

40

Detalles Bibliográficos
Autores principales: 269176 Rose, F. W. G., Sandiford, D. J., Williams, I.
Formato:
Publicado: Rugby, England : British Thomson - Houston, Research Laboratory, (n.d.)
Materias:
Silicon
Semiconductors

Ejemplares similares