Lifetime in semiconductors : an apparatus for the measurement of carrier liftmen in silicon /

Lifetime in semiconductors : an apparatus for the measurement of carrier liftmen in silicon /

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Détails bibliographiques
Auteurs principaux: 269176 Rose, F. W. G., Sandiford, D. J., Williams, I.
Format:
Publié: Rugby, England : British Thomson - Houston, Research Laboratory, (n.d.)
Sujets:
Silicon
Semiconductors

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