Particle control for semiconductor manufacturing /
16
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New York : Marcel Dekker, Inc.,
1990
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_version_ | 1826381207305191424 |
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author | Donovan, R. P. |
author_facet | Donovan, R. P. |
author_sort | Donovan, R. P. |
collection | OCEAN |
description | 16 |
first_indexed | 2024-03-04T18:57:29Z |
format | |
id | KOHA-OAI-TEST:129631 |
institution | Universiti Teknologi Malaysia - OCEAN |
last_indexed | 2024-03-04T18:57:29Z |
publishDate | 1990 |
publisher | New York : Marcel Dekker, Inc., |
record_format | dspace |
spelling | KOHA-OAI-TEST:1296312020-12-19T17:02:56ZParticle control for semiconductor manufacturing / Donovan, R. P. New York : Marcel Dekker, Inc.,199016PSZJBLSemiconductorsSemiconductorsParticlesURN:ISBN:0824782429 |
spellingShingle | Semiconductors Semiconductors Particles Donovan, R. P. Particle control for semiconductor manufacturing / |
title | Particle control for semiconductor manufacturing / |
title_full | Particle control for semiconductor manufacturing / |
title_fullStr | Particle control for semiconductor manufacturing / |
title_full_unstemmed | Particle control for semiconductor manufacturing / |
title_short | Particle control for semiconductor manufacturing / |
title_sort | particle control for semiconductor manufacturing |
topic | Semiconductors Semiconductors Particles |
work_keys_str_mv | AT donovanrp particlecontrolforsemiconductormanufacturing |