Multiple-beam interference microscopy of metals /
40
Päätekijä: | |
---|---|
Aineistotyyppi: | |
Julkaistu: |
London : Academic Pr.,
1970
|
Aiheet: |
_version_ | 1826386595420307456 |
---|---|
author | 200177 Tolansky, Samuel |
author_facet | 200177 Tolansky, Samuel |
author_sort | 200177 Tolansky, Samuel |
collection | OCEAN |
description | 40 |
first_indexed | 2024-03-04T20:15:39Z |
format | |
id | KOHA-OAI-TEST:155655 |
institution | Universiti Teknologi Malaysia - OCEAN |
last_indexed | 2024-03-04T20:15:39Z |
publishDate | 1970 |
publisher | London : Academic Pr., |
record_format | dspace |
spelling | KOHA-OAI-TEST:1556552020-12-19T17:04:02ZMultiple-beam interference microscopy of metals / 200177 Tolansky, Samuel London : Academic Pr.,197040PSZJBLInterference (Light)InterferometersURN:ISBN:0126926506 |
spellingShingle | Interference (Light) Interferometers 200177 Tolansky, Samuel Multiple-beam interference microscopy of metals / |
title | Multiple-beam interference microscopy of metals / |
title_full | Multiple-beam interference microscopy of metals / |
title_fullStr | Multiple-beam interference microscopy of metals / |
title_full_unstemmed | Multiple-beam interference microscopy of metals / |
title_short | Multiple-beam interference microscopy of metals / |
title_sort | multiple beam interference microscopy of metals |
topic | Interference (Light) Interferometers |
work_keys_str_mv | AT 200177tolanskysamuel multiplebeaminterferencemicroscopyofmetals |