Multiple-beam interference microscopy of metals /

Multiple-beam interference microscopy of metals /

40

Bibliographic Details
Main Author:	200177 Tolansky, Samuel
Format:
Published:	London : Academic Pr., 1970
Subjects:	Interference (Light) Interferometers

Similar Items

Multiple-beam interferometry of surfaces and films/
by: 200177 Tolansky, Samuel
Published: (1970)

Microstructures of surfaces using interferometry/
by: 200177 Tolansky, Samuel
Published: (1968)

Interferometry/
by: 305506 Steel, William Howard
Published: (1967)

Interference Imaging of Refractive Index Distribution in Thin Samples
by: Ivan Turek, et al.
Published: (2004-01-01)

Ultrasonic Transducer Peak-to-Peak Optical Measurement
by: Pavel Skarvada, et al.
Published: (2012-01-01)

Determining Topological Charge of Bessel-Gaussian Beams Using Modified Mach-Zehnder Interferometer
by: Mansi Baliyan, et al.
Published: (2024-03-01)

A theoretical-practical study on poles and zeros calculated from a filtered modulated function of an interference pattern
by: José Trinidad Guillen Bonilla, et al.
Published: (2021-08-01)

Vaisala interference comparator/
by: 308733 Kukkamaki, T. J.
Published: (1978)

Wave optics : interference and diffraction/
by: 446060 Curry, Collin
Published: (1957)

Polarization interferometers : applications in microscopy and macroscopy/
by: 281353 Francon, Maurice, et al.
Published: (1971)

Interference of electromagnetic waves/
by: 357274 Cook, Alan H.
Published: (1971)

An introduction to interferometry /
by: 200177 Tolansky, Samuel
Published: (1955)

Introduction to atomic physics/
by: 200177 Tolansky, Samuel
Published: (1963)

Introduction to atomic physics/
by: 200177 Tolansky, Samuel
Published: (1956)

Hyperfine structure in line spectra and nuclear spin/
by: 200177 Tolansky, Samuel
Published: (1948)

Interference 1-2 [filem gelung]
Published: (1971)

Three-beam shearing interferometer for measuring thin film thickness, surface roughness and surface figure / [mikrofilem]
by: 392415 Almarzouk, Kais

Design and Analysis of a Long-Stroke and High-Precision Positioning System for Scanning Beam Interference Lithography
by: Hao Chen, et al.
Published: (2023-12-01)

Frequency-locked diode laser for interferometric sensing systems /
by: 458701 Webb, D. J., et al.

Characteristics of Spiral Patterns Formed by Coaxial Interference between Two Vortex Beams with Different Radii of Wavefront Curvatures
by: Jingbo Ma, et al.
Published: (2021-09-01)

Diffraction model of a laser speckle interferometer for measuring micro-displacements of objects with scattering surface
by: B.A. Grizbil, et al.
Published: (2020-08-01)

Large-Beam Picosecond Interference Patterning of Metallic Substrates
by: Petr Hauschwitz, et al.
Published: (2020-10-01)

Structured illumination microscopy based on asymmetric three-beam interference
by: Linyu Xu, et al.
Published: (2021-03-01)

Design of an interference system for measuring the transverse beam size in HLS-II
by: Sanshuang Jin, et al.
Published: (2022-12-01)

Multi-Field Interference Simultaneously Imaging on Single Image for Dynamic Surface Measurement
by: Weiqiang Han, et al.
Published: (2020-06-01)

Contributions to interference microscopy/ Wolfgang Krug, Jaochim Rienitz, Gunter Schulz;
by: 236220 Krug, Wolfgang, et al.
Published: (1964)

Squeezing for cosmic symphony
by: Mengyao Wang, et al.
Published: (2023-02-01)

Simultaneous Measurement of Group Refractive Index Dispersion and Thickness of Fused Silica Using a Scanning White Light Interferometer
by: Heesu Lee, et al.
Published: (2023-12-01)

Multiple Interacting Narrowband Interferences Suppression Algorithm for OFDM Systems
by: Chengwen Zhang, et al.
Published: (2020-01-01)

White-Light Interference Microscopy Image Super-Resolution Using Generative Adversarial Networks
by: Haowei Li, et al.
Published: (2020-01-01)

Analysis and Design of Fiber Microprobe Displacement Sensors Including Collimated Type and Convergent Type for Ultra-Precision Displacement Measurement
by: Yisi Dong, et al.
Published: (2024-01-01)

USING THE BROADBAND DIGITAL RECEIVERS IN INTERFEROMETER OBSERVATIONS WITH THE URAN NETWORK
by: V. A. Shepelev, et al.
Published: (2017-12-01)

Application of imaging ellipsometry and white light interference microscopy for detection of defects in epitaxially grown 4H–SiC layers
by: Ermilova Elena, et al.
Published: (2023-01-01)

Comparison of Two- and Three-Beam Interference Pattern Generation in Structured Illumination Microscopy
by: Jiuling Liao, et al.
Published: (2021-11-01)

A disturbed optical interferometric sensor analyzed on complex s-plane: A new novel vectorial detection technique for the interference patterns
by: José Trinidad Guillen Bonilla, et al.
Published: (2023-03-01)

Design of fringe locking system for laser interferometer [microfilm] /
by: Chen, Lee Chuin
Published: (2000)

Penyusunan interferometer Mach-Zehnder/
by: 330351 Abdul Rahim Bujang
Published: (1991)

Design of fringe locking system for laser interferometer /
by: 442532 Chen, Lee Chuin
Published: (2000)

Flexible Method for Generating Arbitrary Vector Beams Based on Modified Off-Axis Interference-Type Hologram Encoding
by: Zhiyu Liu, et al.
Published: (2022-12-01)

Applications of holography/
by: United States-Japan Seminar on Information Processeing by Holography (1969 : Washington, D.C), et al.
Published: (1971)