Random power supply as a test vector to expose soft defects in CMOS digital circuits [microfilm] /
Thesis (Master in Electrical Engineering) - Universiti Teknologi Malaysia, 2000
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Language: | eng |
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Skudai : Universiti Teknologi Malaysia,
2000
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_version_ | 1796648082885050368 |
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author | Izam Kamisian |
author_facet | Izam Kamisian |
author_sort | Izam Kamisian |
collection | OCEAN |
description | Thesis (Master in Electrical Engineering) - Universiti Teknologi Malaysia, 2000 |
first_indexed | 2024-03-04T13:16:38Z |
format | |
id | KOHA-OAI-TEST:16116 |
institution | Universiti Teknologi Malaysia - OCEAN |
language | eng |
last_indexed | 2024-03-04T13:16:38Z |
publishDate | 2000 |
publisher | Skudai : Universiti Teknologi Malaysia, |
record_format | dspace |
spelling | KOHA-OAI-TEST:161162020-12-19T16:55:44ZRandom power supply as a test vector to expose soft defects in CMOS digital circuits [microfilm] / Izam Kamisian Skudai : Universiti Teknologi Malaysia,2000engThesis (Master in Electrical Engineering) - Universiti Teknologi Malaysia, 2000Pengkajian bahan tambahan elektrolit asid sulfurik untuk mengurangkan pensulfatan dalam sistem bateri asid plumbum -- Mangkin berasaskan oksida mangan bagi rawatan emisi gas toksik -- Implementation of supervisory control and direct digital control to a hot air blower systemPSZJBLPower resourcesElectric power production |
spellingShingle | Power resources Electric power production Izam Kamisian Random power supply as a test vector to expose soft defects in CMOS digital circuits [microfilm] / |
title | Random power supply as a test vector to expose soft defects in CMOS digital circuits [microfilm] / |
title_full | Random power supply as a test vector to expose soft defects in CMOS digital circuits [microfilm] / |
title_fullStr | Random power supply as a test vector to expose soft defects in CMOS digital circuits [microfilm] / |
title_full_unstemmed | Random power supply as a test vector to expose soft defects in CMOS digital circuits [microfilm] / |
title_short | Random power supply as a test vector to expose soft defects in CMOS digital circuits [microfilm] / |
title_sort | random power supply as a test vector to expose soft defects in cmos digital circuits microfilm |
topic | Power resources Electric power production |
work_keys_str_mv | AT izamkamisian randompowersupplyasatestvectortoexposesoftdefectsincmosdigitalcircuitsmicrofilm |