Random power supply as a test vector to expose soft defects in CMOS digital circuits [microfilm] /

Random power supply as a test vector to expose soft defects in CMOS digital circuits [microfilm] /

Thesis (Master in Electrical Engineering) - Universiti Teknologi Malaysia, 2000

Bibliographic Details
Main Author:	Izam Kamisian
Format:
Language:	eng
Published:	Skudai : Universiti Teknologi Malaysia, 2000
Subjects:	Power resources Electric power production

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